OMTEC 2012 SmartInspectionStation™ Demo and "Choose All Three" Presentation

Meet us at OMTEC, Booth #831-833, June 13-14, 2012 Register to attend. Forward to a Friend Presented by: Bill Greene Chief Executive Officer Level 3 Inspection LLC Price, Quality, Speed: Choose All Three Thursday, June 14, 2012, 10:00 a.m. - 10:45 a.m. Orthopaedic Manufacturing & Technology Exposition & Conference Donald E. Stephens Convention Center, Rosemont, Illinois Participants will learn about the advantages of Computer Aided Inspection for orthopaedic devices: Make better parts faster, with fewer iterations, greater confidence and lower cost SPC tracking and trending of dimensions to reduce sampling rates Trim 30% from new product time-to-market (TTM), saving millions of dollars Reduce legal exposure by avoiding expensive product performance liability problems Witness the Power of the SmartInspectionSystem™! The SiS™ is an easy-to-use fully-automated Structured Light Metrology (SLM) and Computer Aided Inspection (CAI) system that orthopaedic and other precision manufacturers can install practically anywhere in their operations. This patent-pending system uses SLM in tandem with a programmable part positioner and Geomagic Qualify™ to digitize the surfaces of orthopaedic implants and other precision manufactured parts, automatically generating full PDF inspection reports in mere minutes, with minimal operator input and personnel training. The SiS™ is highly configurable, offering scanning resolutions of 4, 5, and 11 (or more) megapixels, with measuring volumes ranging from 50-380mm (or bigger) to generate very high scan data density as needed per part, feature, and tolerance. Come and see the SiS™ in operation at OMTEC Booth #831-833, June 13-14, 2012. Register to attend. Copyright © 2012 Level 3 Inspection LLC, All rights reserved.